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Innovations and Advanced Techniques in Analytical Microscopy for Metals

Microscopy Workshop on advanced techniques for analysis of metals, such as Image analysis using machine learning, FIB-SEM and LAB dCT synchrotron style crystallography, and the latest development in EDS & EBSD. The workshop is held by ZEISS in cooperation with Oxford Instruments and Swerim AB.  

Date and time
November 6, 2019
9:30-15:15h

Location
Swerim, Kista.
Exact place will be informed to all registered by email one week prior to the workshop.

Program

09:30 - 09:50

Breakfast mingle

 

09:50 - 10:00

Welcome & Introduction

Fredrik Gustavsson – Swerim

10:00 - 10:45

Techniques in optical microscopy (an introduction)
Machine learning & GxP
Surface analysis: roughness, wear, contamination, corrosion, coatings

Andy Holwell, ZEISS

10:45 - 10:55

Break

 

10:55 - 11:40

Correlative microscopy
Technology focus on FESEM, Sigma and Gemini
Introduction to FIB-SEM, the ZEISS Crossbeam

Andy Holwell, ZEISS

11:40 - 11:50

Break

 

11:50 - 12:30

Femtosecond laser – massive ablation for rapid sample preparation 
in FIB-SEM 3D, 4D and correlative tomography (includes FIB-EDS/EBSD, Atlas) 
LabDCT – non-destructive synchrotron-style 3D crystallography of metals in the laboratory

Andy Holwell, ZEISS

12:30 - 13:30

ZEISS & Oxford invites all for lunch

 

13:30 - 14:15

Latest development in X-ray analysis

Sam Marks, Oxford Nordiska

14:15 - 14:30

Break

 

14:30 - 15:15

Latest development in EBSD analysis

Håkan Vikström, Oxford Nordiska