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Innovations and Advanced Techniques in Analytical Microscopy for Metals

Microscopy Workshop on advanced techniques for analysis of metals, such as Image analysis using machine learning, FIB-SEM and LAB dCT synchrotron style crystallography, and the latest development in EDS & EBSD. The workshop is held by ZEISS in cooperation with Oxford Instruments and Swerim AB.  

Date and time
November 6, 2019

Swerim, Kista.
Exact place will be informed to all registered by email one week prior to the workshop.


09:30 - 09:50

Breakfast mingle


09:50 - 10:00

Welcome & Introduction

Fredrik Gustavsson – Swerim

10:00 - 10:45

Techniques in optical microscopy (an introduction)
Machine learning & GxP
Surface analysis: roughness, wear, contamination, corrosion, coatings

Andy Holwell, ZEISS

10:45 - 10:55



10:55 - 11:40

Correlative microscopy
Technology focus on FESEM, Sigma and Gemini
Introduction to FIB-SEM, the ZEISS Crossbeam

Andy Holwell, ZEISS

11:40 - 11:50



11:50 - 12:30

Femtosecond laser – massive ablation for rapid sample preparation 
in FIB-SEM 3D, 4D and correlative tomography (includes FIB-EDS/EBSD, Atlas) 
LabDCT – non-destructive synchrotron-style 3D crystallography of metals in the laboratory

Andy Holwell, ZEISS

12:30 - 13:30

ZEISS & Oxford invites all for lunch


13:30 - 14:15

Latest development in X-ray analysis

Sam Marks, Oxford Nordiska

14:15 - 14:30



14:30 - 15:15

Latest development in EBSD analysis

Håkan Vikström, Oxford Nordiska